Dielectric versus topographic contrast in near-field microscopy

نویسندگان

  • Olivier J. F. Martin
  • Christian Girard
  • Alain Dereux
چکیده

Using a fully vectorial three-dimensional numerical approach (generalized field propagator, based on Green’s tensor technique), we investigate the near-field images produced by subwavelength objects buried in a dielectric surface. We study the influence of the object index, size, and depth on the near field. We emphasize the similarity between the near field spawned by an object buried in the surface (dielectric contrast) and that spawned by a protrusion on the surface (topographic contrast). We show that a buried object with a negative dielectric contrast (i.e., with a smaller index than its surrounding medium) produces a near-field image that is reversed from that of an object with a positive contrast. © 1996 Optical Society of America.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

On contrast parameters and topographic artifacts in near-field infrared microscopy

Near-field microscopy overcomes the diffraction limit through the partial conversion of the evanescent fields, formed around the subwavelength sources of light, into propagating waves by interactions between the probe and the sample. Contrast parameters in this imaging technique are quite different from those in conventional ~far-field! optics. We study the mechanisms of image formation in the ...

متن کامل

Design and fabrication of a high-Q near-field probe for subsurface crack detection

Non-destructive detection and evaluation of invisible cracks in metal structures is an important matter in several critical environments including ground transportation, air transportation and power plants. In this paper, a high-Q near-field Microwave probe is designed and fabricated using defected ground structures for surface and subsurface crack detection in metal structures. For this purpos...

متن کامل

Near-field optical microscopy and spectroscopy with pointed probes.

In recent years, developments in near-field techniques exploiting far-field illumination of a pointed, apertureless probe have demonstrated a newfound excitement. This is due in part to the advantages afforded by apertureless techniques that allow for the practical implementation of spectroscopic contrast mechanisms at length scales below 100 nm. These mechanisms include Raman and infrared abso...

متن کامل

Near-field scattering of longitudinal fields

Longitudinal fields created in strongly focused laser beams are investigated by near-field optical microscopy. Sharp metallic and dielectric tips are raster scanned through the focus of these modes. It is found that regardless of the tip material, the signal scattered by the tip is a measure for the strength of the local longitudinal field. A surprising contrast reversal is observed between the...

متن کامل

Apertureless near-field optical microscopy: Tip–sample coupling in elastic light scattering

For linear light scattering in apertureless scanning near-field optical microscopy, we have studied the correlations between the tip radius of the probe, signal strength, spatial resolution, and sample material. Pronounced variations of the near-field distance dependence on tip shape and dielectric function of the sample are observed. For very sharp metal tips, the scattered near-field signal d...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 1996